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Title
Optimal bayesian experimental design for crossover semiconductor lifetime studies / Stefan Schrunner, B.Sc.
AuthorSchrunner, Stefan
CensorPilz, Jürgen
PublishedKlagenfurt, Juli 2016
Descriptionvii, 71 Blätter : Diagramme
Institutional NoteAlpen Adria Universität Klagenfurt, Masterarbeit, 2016
LanguageEnglish
Document typeMaster Thesis
URNurn:nbn:at:at-ubk:1-15251 Persistent Identifier (URN)
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 The work is publicly available
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